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20 April 2006 Complex transmittance gratings based on subwavelength metallic structures
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Subwavelength metallic structures are used to design gratings with a great variety of transmittance levels. Such gratings can answer growing needs for complex transmittance devices, particularly useful for wave-front analysis applications. Having in mind the conception of a perfectly sinusoidal transmittance for the mid-infrared, we have decided to test the ability of subwavelength lamellar gratings to code the transmittance with several levels. In order to calibrate gratings transmission, as a function of the fill factor, we have designed, realized and measured samples made of six 2mm x 2mm gratings, with transmittance ranging from 10% to 95%. Experimental results for TM- and TE-polarized light are reported and analysed.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. Vincent, R. Haïdar, S. Collin, E. Cambril, S. Velghe, J. Primot, F. Pardo, and J.-L. Pelouard "Complex transmittance gratings based on subwavelength metallic structures", Proc. SPIE 6195, Nanophotonics, 61951K (20 April 2006);

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