Resistor array infrared projector temperature resolution: revisited

Owen M. Williams; Leszek Swierkowski; Breck A. Sieglinger; George C. Goldsmith II

doi:10.1117/12.663181

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16 May 2006 Resistor array infrared projector temperature resolution: revisited

Owen M. Williams, Leszek Swierkowski, Breck A. Sieglinger, George C. Goldsmith II

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Proceedings Volume 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI; 62080V (2006) https://doi.org/10.1117/12.663181
Event: Defense and Security Symposium, 2006, Orlando (Kissimmee), Florida, United States

Abstract

Resistor array infrared projectors offer the unique potential of simultaneously covering both a wide apparent temperature range and providing fine temperature resolution at low output levels. The temperature resolution capability may not be realized, however, if the projector error sources are not controlled; for example, residual nonuniformity after nonuniformity correction (NUC) procedures have been applied, temporal noise in analog drive voltages and quantization at several points in the projection system, all of which may introduce errors larger than the desired resolution. In this paper the temperature resolution limits are assessed in general. In particular, the quantization errors are assessed and the post-NUC residual nonuniformity levels required for achievement of fine temperature resolution are calculated.

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Owen M. Williams, Leszek Swierkowski, Breck A. Sieglinger, and George C. Goldsmith II "Resistor array infrared projector temperature resolution: revisited", Proc. SPIE 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI, 62080V (16 May 2006); https://doi.org/10.1117/12.663181

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