Real-time scene generation using high-speed pixel processing hardware and open source software

Matthew Price; David Cosby

doi:10.1117/12.665723

16 May 2006 Real-time scene generation using high-speed pixel processing hardware and open source software

Matthew Price, David Cosby

Proceedings Volume 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI; 620817 (2006) https://doi.org/10.1117/12.665723
Event: Defense and Security Symposium, 2006, Orlando (Kissimmee), Florida, United States

Abstract

Modern, military scene generators increasingly utilize advanced features of consumer graphics hardware to produce wave band-specific sensor scenes. Unfortunately the advances available in the consumer graphics accelerator market do not translate immediately into product applications for military scene generators required to test next generation sensors. Testing infrared (IR) sensors used in terminal homing missiles and missile warning systems (MWS) require generating frame rates of 200 Hz or more. Modern IR emitter arrays are now able to project dynamic scenes at this higher rate, however personal computer (PC) based scene rendering systems cannot generate high-resolution, real-time frames fast enough. InterSpace has leveraged its high-speed pixel processor technology to produce high-speed rendering based on PC devices. The Hardware-in-the-Loop Functional Area of the US Army Aviation and Missile Research Development and Engineering Center has developed a suite of modular software to perform deterministic real-time, wave band-specific rendering of sensor scenes, leveraging the features of commodity graphics hardware and open source software. Together, these technologies provide the performance and accuracy to drive high-rate, high-dynamic range scene projectors.

Citation Download Citation

Matthew Price and David Cosby "Real-time scene generation using high-speed pixel processing hardware and open source software", Proc. SPIE 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI, 620817 (16 May 2006); https://doi.org/10.1117/12.665723

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