Paper
10 June 2006 Structural and nonlinear-optical studies of ultrathin Si/Si02 multiple quantum wells
Author Affiliations +
Proceedings Volume 6260, Micro- and Nanoelectronics 2005; 626016 (2006) https://doi.org/10.1117/12.683402
Event: Micro- and Nanoelectronics 2005, 2005, Zvenigorod, Russian Federation
Abstract
Optical second harmonic generation (SHG) in amorphous Si/SiO2 multiple quantum wells (MQW) is studied by means of SHG spectroscopy, SHG interferometric spectroscopy and X-ray double-axes reflectometry of the MQW samples with the Si quantum well thickness d ranging from 1.00 to 0.25 nm. The electron density profiles obtained from X-ray reflectometry data confirm multilayer structure presence and refine growth data on d values. The observed modification of the SHG spectra upon decreasing d is interpreted using combination of the resonant two-subband approximation for the nonlocal optical response of each quantum well with the generalized transfer-matrix formalism for the description of light propagation across the whole MQW structure. Agreement with the experiment shows that the description of the quadratic optical response of the MQW structure within the model of a nonlocal piecewise-continuous medium remains valid on the sub-nanometer scale.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrei A. Lomov, Arseniy G. Sutyrin, Denis Yu. Prokhorov, Tatyana V. Dolgova, Andrei A. Fedyanin, and Oleg A. Aktsipetrov "Structural and nonlinear-optical studies of ultrathin Si/Si02 multiple quantum wells", Proc. SPIE 6260, Micro- and Nanoelectronics 2005, 626016 (10 June 2006); https://doi.org/10.1117/12.683402
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Second-harmonic generation

Quantum wells

Silicon

X-rays

Reflectometry

Anisotropy

Geometrical optics

Back to Top