Methodology to simulate parasitic reflection and birefringence in optical pickup units and sensors

Robert P. Dahlgren; Kenneth D. Pedrotti

doi:10.1117/12.685193

22 June 2006 Methodology to simulate parasitic reflection and birefringence in optical pickup units and sensors

Proceedings Volume 6282, Optical Data Storage 2006; 628222 (2006) https://doi.org/10.1117/12.685193
Event: Optical Data Storage 2006, 2006, Montréal, Canada

Abstract

A novel technique is presented for the computation of the polarization transfer function of optical assemblies with finite reflection coefficients, birefringence, and other parasitic imperfections. The methodology is directly applicable to optical data storage modeling, such as CD/DVD recording optics and the physical recording process.

Citation Download Citation

Robert P. Dahlgren and Kenneth D. Pedrotti "Methodology to simulate parasitic reflection and birefringence in optical pickup units and sensors", Proc. SPIE 6282, Optical Data Storage 2006, 628222 (22 June 2006); https://doi.org/10.1117/12.685193

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