Use of solid phase microextraction to verify nitrogen purge gas purity

Amy A. Hofstra; Patrick G. Hogue

doi:10.1117/12.681017

7 September 2006 Use of solid phase microextraction to verify nitrogen purge gas purity

Amy A. Hofstra, Patrick G. Hogue

Proceedings Volume 6291, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II; 629105 (2006) https://doi.org/10.1117/12.681017
Event: SPIE Optics + Photonics, 2006, San Diego, California, United States

Abstract

The preliminary investigation of solid phase microextraction (SPME) as a method for conducting contamination analysis in clean nitrogen streams is presented. The basic operation and the potential advantages of SPME technology are presented for readers unfamiliar with the technique. A detailed description of sample collection and analysis is provided. A discussion of sampling theory and quantification is also included. Results of laboratory experiments and some preliminary field tests are discussed, as well as the direction for future development of the technique.

Citation Download Citation

Amy A. Hofstra and Patrick G. Hogue "Use of solid phase microextraction to verify nitrogen purge gas purity", Proc. SPIE 6291, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II, 629105 (7 September 2006); https://doi.org/10.1117/12.681017

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