Current-induced frequency modulation characteristics in semiconductor lasers using a novel and simple method

Jianhui Zhu; Min Zhang; Yanbiao Liao; Jin Tang

doi:10.1117/12.678212

14 August 2006 Current-induced frequency modulation characteristics in semiconductor lasers using a novel and simple method

Jianhui Zhu, Min Zhang, Yanbiao Liao, Jin Tang

Author Affiliations +

Proceedings Volume 6293, Interferometry XIII: Applications; 62930V (2006) https://doi.org/10.1117/12.678212
Event: SPIE Optics + Photonics, 2006, San Diego, California, United States

Abstract

In this paper, a simple method for measuring current-induced frequency modulation characteristics of semiconductor lasers is reported. In this method, no complicated optical and measuring system is needed and is easy for practical application. The experimental results in low modulation frequency range show 0.2% in accuracy is achieved and the system is fit for measuring the current-induced frequency modulation characteristics of semiconductor lasers.

Citation Download Citation

Jianhui Zhu, Min Zhang, Yanbiao Liao, and Jin Tang "Current-induced frequency modulation characteristics in semiconductor lasers using a novel and simple method", Proc. SPIE 6293, Interferometry XIII: Applications, 62930V (14 August 2006); https://doi.org/10.1117/12.678212

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available