Closed-loop adaptive optics using a CMOS image quality metric sensor

Chueh Ting; Aditya Rayankula; Michael K. Giles; Paul M. Furth

doi:10.1117/12.682274

29 August 2006 Closed-loop adaptive optics using a CMOS image quality metric sensor

Chueh Ting, Aditya Rayankula, Michael K. Giles, Paul M. Furth

Proceedings Volume 6306, Advanced Wavefront Control: Methods, Devices, and Applications IV; 63060C (2006) https://doi.org/10.1117/12.682274
Event: SPIE Optics + Photonics, 2006, San Diego, California, United States

Abstract

When compared to a Shack-Hartmann sensor, a CMOS image sharpness sensor has the advantage of reduced complexity in a closed-loop adaptive optics system. It also has the potential to be implemented as a smart sensor using VLSI technology. In this paper, we present a novel adaptive optics testbed that uses a CMOS sharpness imager built in the New Mexico State University (NMSU) Electro-Optics Research Laboratory (EORL). The adaptive optics testbed, which includes a CMOS image quality metric sensor and a 37-channel deformable mirror, has the capability to rapidly compensate higher-order phase aberrations. An experimental performance comparison of the pinhole image sharpness feedback method and the CMOS imager is presented. The experimental data shows that the CMOS sharpness imager works well in a closed-loop adaptive optics system. Its overall performance is better than that of the pinhole method, and it has a fast response time.

Citation Download Citation

Chueh Ting, Aditya Rayankula, Michael K. Giles, and Paul M. Furth "Closed-loop adaptive optics using a CMOS image quality metric sensor", Proc. SPIE 6306, Advanced Wavefront Control: Methods, Devices, and Applications IV, 63060C (29 August 2006); https://doi.org/10.1117/12.682274

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