Projected fringe profilometry using a supercontinum light illumination for micro-scale measurements

Wei-Hung Su; Chia-Jeng Huang

doi:10.1117/12.679505

24 August 2006 Projected fringe profilometry using a supercontinum light illumination for micro-scale measurements

Wei-Hung Su, Chia-Jeng Huang

Proceedings Volume 6314, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications XII; 63141D (2006) https://doi.org/10.1117/12.679505
Event: SPIE Optics + Photonics, 2006, San Diego, California, United States

Abstract

In this paper, a projected fringe profilometry using a supercontinuum light source generated by launching femto second laser pulses into a highly nonlinear photonic crystal fiber is presented. The proposed profilometry for micro-scale measurements has the following major advantages: (1) large-depth-of-field in the projection system, (2) ease of calibration, and (3) little speckle noise.

Citation Download Citation

Wei-Hung Su and Chia-Jeng Huang "Projected fringe profilometry using a supercontinum light illumination for micro-scale measurements", Proc. SPIE 6314, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications XII, 63141D (24 August 2006); https://doi.org/10.1117/12.679505

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available