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15 September 2006 Electric speckle pattern interferometry based on spatial fringe analysis method using multicamera
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Proceedings Volume 6341, Speckle06: Speckles, From Grains to Flowers; 63410K (2006) https://doi.org/10.1117/12.695287
Event: Speckle06: Speckles, From Grains to Flowers, 2006, Nimes, France
Abstract
A novel optical system for speckle interferometry is proposed in this paper. The optical system required only 2 cameras by combining the temporal and the spatial fringe scanning methods instead of ordinary optical system which required 3 cameras at least. As results, the interferometry using multi-camera method can be realized with just 2 cameras. In the experimental results, it is confirmed that measurement for out of plane displacement that includes a large deformation in measured object can be precisely performed by the new optical system. Then, the measurement with large deformation is performed as the accumulation of the continuous measurement results with the small deformation measurement.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yasuhiko Arai and Shunsuke Yokozeki "Electric speckle pattern interferometry based on spatial fringe analysis method using multicamera", Proc. SPIE 6341, Speckle06: Speckles, From Grains to Flowers, 63410K (15 September 2006); https://doi.org/10.1117/12.695287
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