Sub-pixel speckle displacement measurement by using optical vortex metrology

Wei Wang; Tomoaki Yokozeki; Reika Ishijima; Atsushi Wada; Steen G. Hanson; Yoko Miyamoto; Mitsuo Takeda

doi:10.1117/12.695358

15 September 2006 Sub-pixel speckle displacement measurement by using optical vortex metrology

Wei Wang, Tomoaki Yokozeki, Reika Ishijima, Atsushi Wada, Steen G. Hanson, Yoko Miyamoto, Mitsuo Takeda

Proceedings Volume 6341, Speckle06: Speckles, From Grains to Flowers; 634117 (2006) https://doi.org/10.1117/12.695358
Event: Speckle06: Speckles, From Grains to Flowers, 2006, Nimes, France

Abstract

As an alternative to correlation-based techniques widely used in conventional speckle metrology, we propose a new technique that makes use of phase singularities in the complex analytic signal of a speckle pattern as indicators of local speckle displacements. The complex analytic signal is generated by vortex filtering the speckle pattern. Experimental results are presented that demonstrate the validity and the performance of the proposed optical vortex metrology with nano-scale resolution.

Citation Download Citation

Wei Wang, Tomoaki Yokozeki, Reika Ishijima, Atsushi Wada, Steen G. Hanson, Yoko Miyamoto, and Mitsuo Takeda "Sub-pixel speckle displacement measurement by using optical vortex metrology", Proc. SPIE 6341, Speckle06: Speckles, From Grains to Flowers, 634117 (15 September 2006); https://doi.org/10.1117/12.695358

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