Techniques for characterizing waveguide gratings and grating-based devices

Ernst Brinkmeyer; Sven Kieckbusch; Frank Knappe

doi:10.1117/12.707798

8 September 2006 Techniques for characterizing waveguide gratings and grating-based devices

Ernst Brinkmeyer, Sven Kieckbusch, Frank Knappe

Proceedings Volume 6343, Photonics North 2006; 63431U (2006) https://doi.org/10.1117/12.707798
Event: Photonics North 2006, 2006, Quebec City, Canada

Abstract

Waveguide gratings used in laser technology, optical sensing or optical communications have to serve different specific purposes and, hence, have to have specific optical properties which can be tailored to a large extent. Characterization methods are required not only to measure the actual effect of a Bragg grating or long period grating under consideration but also to unveil the cause, i.e. to determine its spatial structure. This paper reviews the present status of the respective experimental characterization techniques. The methods emphasized rely on phase sensitive reflectometry together with advanced inverse scattering evaluation algorithms.

Citation Download Citation

Ernst Brinkmeyer, Sven Kieckbusch, and Frank Knappe "Techniques for characterizing waveguide gratings and grating-based devices", Proc. SPIE 6343, Photonics North 2006, 63431U (8 September 2006); https://doi.org/10.1117/12.707798

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