Testing of application specific integrated circuit in LabVIEW environment

Piotr Maj

doi:10.1117/12.714534

12 October 2006 Testing of application specific integrated circuit in LabVIEW environment

Piotr Maj

Proceedings Volume 6347, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006; 63470H (2006) https://doi.org/10.1117/12.714534
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006, 2006, Wilga, Poland

Abstract

The process of implementation of a new Application Specific Integrated Circuit (ASIC) consists of several stages like designing, production and testing. To verify, if the ASIC fulfills all project specifications, sets of special tests are necessary, especially in the case of new scientific experiments in physics, material science or biology. Nowadays mostly the PC computers with dedicated hardware can communicate with the ASIC and perform those tests. Every new ASIC requires it's own dedicated software that performs specific communication protocol and contains many characteristic functions to test the parameters of the ASIC. The time for testing the new ASIC can be significantly shorten if the program blocks are properly written, i.e. there is a possibility to change the functionality of those blocks instantly to make some additional tests. In this article, we show an example of testing a 64-channel ASIC called DEDIX, which is used for fast digital X-ray imaging applications. The ASIC has been fabricated in 0.35 μm CMOS technology. Using a special software developed in LabVIEW environment, we tested analogue parameters of the front-end channels (gain, noise, offsets), the parameters of digital to analogue converters as well as functionality and speed of digital blocks. We concentrate on these programming techniques, which considerably speed up the developing of dedicated software for testing the new ASIC.

Citation Download Citation

Piotr Maj "Testing of application specific integrated circuit in LabVIEW environment", Proc. SPIE 6347, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006, 63470H (12 October 2006); https://doi.org/10.1117/12.714534

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KEYWORDS

LabVIEW

Computer programming

Software development

Application specific integrated circuits

Data communications

Silicon

Data acquisition

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