Paper
12 October 2006 Measurement system for thermal drift of propagation time in fast pulse circuits
Piotr Z. Wieczorek
Author Affiliations +
Proceedings Volume 6347, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006; 63472F (2006) https://doi.org/10.1117/12.714692
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006, 2006, Wilga, Poland
Abstract
The paper presents a precise measurement system for the thermal drift of propagation delay in digital circuits. The design technique and essential units of system have been described. The method of short time estimation is also shown. Results of the time drift in popular bipolar and CMOS circuits are discussed. A brief explanation of significant drift of CMOS circuit delay has been shown.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Piotr Z. Wieczorek "Measurement system for thermal drift of propagation time in fast pulse circuits", Proc. SPIE 6347, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006, 63472F (12 October 2006); https://doi.org/10.1117/12.714692
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KEYWORDS
Temperature metrology

Time metrology

Digital electronics

Thermoelectric materials

Error analysis

Manufacturing

Picosecond phenomena

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