GPS estimation of uncertainty in three-dimensional flatness measurements

Yonghou Sun; Ya Zhang; Meifa Huang; Yanru Zhong

doi:10.1117/12.717171

6 November 2006 GPS estimation of uncertainty in three-dimensional flatness measurements

Yonghou Sun, Ya Zhang, Meifa Huang, Yanru Zhong

Proceedings Volume 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence; 635737 (2006) https://doi.org/10.1117/12.717171
Event: Sixth International Symposium on Instrumentation and Control Technology, 2006, Beijing, China

Abstract

Improved Geometrical Product Specifications (GPS) standards system is the foundation of the technology standards and metrology specifications of mechanical and electric products. GPS estimation of uncertainty should assure the integrity and reliability of the verification result of products. According to the requirements of the improved GPS system, the decision rule based on compliance uncertainty is adopted in this paper to decide whether the flatness can be accepted or not. Then the calculation equation of compliance uncertainty in three-dimensional flatness measuring process is deduced based on the basic principle of least-square verification and the transparent box model given in ISO/TS 14253-2. An experimental research is also given to validate the method proposed in this paper.

Citation Download Citation

Yonghou Sun, Ya Zhang, Meifa Huang, and Yanru Zhong "GPS estimation of uncertainty in three-dimensional flatness measurements", Proc. SPIE 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635737 (6 November 2006); https://doi.org/10.1117/12.717171

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