Research of the new optical diffractive super-resolution element of the two-photon microfabrication

Peng Wei; Yu Zhu; Guanghong Duan

doi:10.1117/12.717280

6 November 2006 Research of the new optical diffractive super-resolution element of the two-photon microfabrication

Peng Wei, Yu Zhu, Guanghong Duan

Proceedings Volume 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence; 635743 (2006) https://doi.org/10.1117/12.717280
Event: Sixth International Symposium on Instrumentation and Control Technology, 2006, Beijing, China

Abstract

The new optical diffractive superresolution element (DSE) is being applied to improve the microfabrication radial superresolution in the two-photon three-dimension (3D) microfabrication system, which appeared only a few years ago and can provide the ability to confine photochemical and physical reactions to the order of laser wavelength in three dimensions. The design method of the DSE is that minimizing M if the lowest limit S_l of the S and the highest limit G_u of the G is set, where Liu [1] explained the definition of the S, M and G. Simulation test result proved that the microfabrication radial superresolution can be improved by the new optical DSE. The phenomenon can only be interpreted as the intensity of high-order and side of the zero-order diffraction peaks have been clapped under the twophoton absorption (TPA) polymerization threshold. In a word the polymerized volume can be chosen because the S_land the G_u is correspondingly adjustable, even if the laser wavelength, objective lens and the photosensitive resin is fixed for a given two-photon microfabrication system. That means the radial superresolution of the two-photon microfabrication can be chosen.

Citation Download Citation

Peng Wei, Yu Zhu, and Guanghong Duan "Research of the new optical diffractive super-resolution element of the two-photon microfabrication", Proc. SPIE 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635743 (6 November 2006); https://doi.org/10.1117/12.717280

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