Paper
20 October 2006 Detection of fecal/ingesta contaminants at slaughter plants from a number of characteristic visible and near-infrared bands
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Proceedings Volume 6381, Optics for Natural Resources, Agriculture, and Foods; 63810U (2006) https://doi.org/10.1117/12.686225
Event: Optics East 2006, 2006, Boston, Massachusetts, United States
Abstract
Several of visible and NIR bands were sought to explore the potential for the classification of fecal / ingesta ("F/I") objectives from rubber belt and stainless steel ("RB/SS") backgrounds. Spectral features of "F/I" objectives and "RB/SS" backgrounds showed large differences in both visible and NIR regions, due to the diversity of their chemical compositions. Such spectral distinctions formed the basis on which to develop simple three-band ratio algorithms for the classification analysis. Meanwhile, score-score plots from principal component analysis (PCA) indicated the obvious cluster separation between "F/I" objectives and "RB/SS" backgrounds, but the corresponding loadings did not show any specific wavelengths for developing effective algorithms. Furthermore, 2-class soft independent modeling of class analogy (SIMCA) models were developed to compare the correct classifications with those from the ratio algorithms. Results indicated that using ratio algorithms in the visible or NIR region could separate "F/I" objectives from "RB/SS" backgrounds with a success rate of over 97%.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yongliang Liu, Kuanglin Chao, Yud-Ren Chen, Moon S. Kim, Xiangwu Nou, Diane E. Chan, and Chun-Chieh Yang "Detection of fecal/ingesta contaminants at slaughter plants from a number of characteristic visible and near-infrared bands", Proc. SPIE 6381, Optics for Natural Resources, Agriculture, and Foods, 63810U (20 October 2006); https://doi.org/10.1117/12.686225
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KEYWORDS
Near infrared

Visible radiation

Forward error correction

Algorithm development

Principal component analysis

Inspection

Reflectivity

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