Measuring part per million thin film absorption during deposition

George Dubé; Arthur J. Braundmeier Jr.; Steve Chelli; Roland Juhala; Anthony Webb

doi:10.1117/12.695179

18 January 2007 Measuring part per million thin film absorption during deposition

George Dubé, Arthur J. Braundmeier Jr., Steve Chelli, Roland Juhala, Anthony Webb

Proceedings Volume 6403, Laser-Induced Damage in Optical Materials: 2006; 64031F (2007) https://doi.org/10.1117/12.695179
Event: Boulder Damage Symposium XXXVIII: Annual Symposium on Optical Materials for High Power Lasers, 2006, Boulder, Colorado, United States

Abstract

Waveguiding was used to measure the extinction coefficient of a thin film while it was being deposited in a vacuum chamber. Experimental results are presented and compared to calculations and measurements by other techniques.

Citation Download Citation

George Dubé, Arthur J. Braundmeier Jr., Steve Chelli, Roland Juhala, and Anthony Webb "Measuring part per million thin film absorption during deposition", Proc. SPIE 6403, Laser-Induced Damage in Optical Materials: 2006, 64031F (18 January 2007); https://doi.org/10.1117/12.695179

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