Paper
20 December 2006 Feature extraction from terahertz pulses for classification of RNA data via support vector machines
Author Affiliations +
Proceedings Volume 6415, Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems III; 641516 (2006) https://doi.org/10.1117/12.695629
Event: SPIE Smart Materials, Nano- and Micro-Smart Systems, 2006, Adelaide, Australia
Abstract
This study investigates binary and multiple classes of classification via support vector machines (SVMs). A couple of groups of two dimensional features are extracted via frequency orientation components, which result in the effective classification of Terahertz (T-ray) pulses for discrimination of RNA data and various powder samples. For each classification task, a pair of extracted feature vectors from the terahertz signals corresponding to each class is viewed as two coordinates and plotted in the same coordinate system. The current classification method extracts specific features from the Fourier spectrum, without applying an extra feature extractor. This method shows that SVMs can employ conventional feature extraction methods for a T-ray classification task. Moreover, we discuss the challenges faced by this method. A pairwise classification method is applied for the multi-class classification of powder samples. Plots of learning vectors assist in understanding the classification task, which exhibit improved clustering, clear learning margins, and least support vectors. This paper highlights the ability to use a small number of features (2D features) for classification via analyzing the frequency spectrum, which greatly reduces the computation complexity in achieving the preferred classification performance.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaoxia Yin, Brian W.-H. Ng, Bernd Fischer, Bradley Ferguson, Samuel P. Mickan, and Derek Abbott "Feature extraction from terahertz pulses for classification of RNA data via support vector machines", Proc. SPIE 6415, Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems III, 641516 (20 December 2006); https://doi.org/10.1117/12.695629
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Cited by 5 scholarly publications.
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KEYWORDS
Terahertz radiation

Feature extraction

Binary data

Image classification

Classification systems

Fourier transforms

Absorption

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