Paper
10 February 2007 Investigation of coherent amplification with a semiconductor optical amplifier employed in a swept source OCT system
Author Affiliations +
Abstract
Optical coherence tomography relies on the coherent gating and coherent amplification from its reference light to produce high axial resolution, high sensitivity image. The signal to noise ratio of the optical coherence tomography image is proportional to the detected back-scattering photon numbers from sample beam. Thus, the gain of an optical amplifier device can be added to the weak sample beam reflected signal while preserving its coherence by the coherent amplification process when the weak back reflected signal is amplified by the optical amplifier device. However, the optical amplifier device will emit spontaneous emission in its coherent amplification process. In this study, we report some preliminary results on the investigation of the coherent amplification and the side effects caused by the spontaneous emission in a swept source OCT system.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bin Rao, Jun Zhang, Qiang Wang, and Zhongping Chen "Investigation of coherent amplification with a semiconductor optical amplifier employed in a swept source OCT system", Proc. SPIE 6429, Coherence Domain Optical Methods and Optical Coherence Tomography in Biomedicine XI, 642924 (10 February 2007); https://doi.org/10.1117/12.704844
Lens.org Logo
CITATIONS
Cited by 6 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Signal to noise ratio

Optical coherence tomography

Tissue optics

Optical amplifiers

Signal processing

Eye

Reflectors

RELATED CONTENT

All optical OC 192 RZ data decision gating in dark...
Proceedings of SPIE (October 19 2006)
Coherent amplified optical coherence tomography
Proceedings of SPIE (July 11 2007)
Optical fibre Fizeau-based OCT
Proceedings of SPIE (June 09 2004)

Back to Top