808 nm tapered diode lasers optimized for high output power and nearly diffraction-limited beam quality in pulse mode operation

Ole Bjarlin Jensen; Andreas Klehr; Frank Dittmar; Bernd Sumpf; Götz Erbert; Peter E. Andersen; Paul Michael Petersen

doi:10.1117/12.700325

7 February 2007 808 nm tapered diode lasers optimized for high output power and nearly diffraction-limited beam quality in pulse mode operation

Ole Bjarlin Jensen, Andreas Klehr, Frank Dittmar, Bernd Sumpf, Götz Erbert, Peter E. Andersen, Paul Michael Petersen

Author Affiliations +

Proceedings Volume 6456, High-Power Diode Laser Technology and Applications V; 64560A (2007) https://doi.org/10.1117/12.700325
Event: Lasers and Applications in Science and Engineering, 2007, San Jose, California, United States

Abstract

808 nm tapered lasers have been investigated under current pulsing conditions without thermal load. The pulse length was 100 ns. The lasers are based on a super-large optical cavity structure with a very small vertical divergence angle of 18° (FWHM). The output power, beam quality and spectral behavior of the lasers were measured. Resonator geometries with different ridge waveguide lengths and taper angles were used for the optimisation of output power and beam quality. As a result, 27 W output power has been achieved. Nearly diffraction-limited beam quality up to 9 W has been obtained with an optimised lateral geometry. At even higher power, spectral broadening and beam quality degradation of the lasers were observed.

Citation Download Citation

Ole Bjarlin Jensen, Andreas Klehr, Frank Dittmar, Bernd Sumpf, Götz Erbert, Peter E. Andersen, and Paul Michael Petersen "808 nm tapered diode lasers optimized for high output power and nearly diffraction-limited beam quality in pulse mode operation", Proc. SPIE 6456, High-Power Diode Laser Technology and Applications V, 64560A (7 February 2007); https://doi.org/10.1117/12.700325

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