Qualitative measurement of average index profile of symmetrical microstructured optical fiber from microscopic imaging

Edgar Saucedo; Vladimir P. Minkovich

doi:10.1117/12.704183

21 February 2007 Qualitative measurement of average index profile of symmetrical microstructured optical fiber from microscopic imaging

Edgar Saucedo, Vladimir P. Minkovich

Author Affiliations +

Proceedings Volume 6501, Sensors, Cameras, and Systems for Scientific/Industrial Applications VIII; 65010Y (2007) https://doi.org/10.1117/12.704183
Event: Electronic Imaging 2007, 2007, San Jose, CA, United States

Abstract

Using a simple non-destructive and non-interferometric technique, we obtained an approximation of the average index profile for a partially symmetrical air-silica microstructured optical fiber. The method proposed in [1] for conventional fibers, where an image of the phase gradients is introduced into a transmitted optical field by a fiber sample, was used. An image of the phase gradients was obtained using a technique based on bright field microscopy. Then, an average of the refractive index profile for optical fibers was reconstructed using the inverse Abel transform.

Citation Download Citation

Edgar Saucedo and Vladimir P. Minkovich "Qualitative measurement of average index profile of symmetrical microstructured optical fiber from microscopic imaging", Proc. SPIE 6501, Sensors, Cameras, and Systems for Scientific/Industrial Applications VIII, 65010Y (21 February 2007); https://doi.org/10.1117/12.704183

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