Paper
17 February 2007 Infrared imaging and machine vision
Author Affiliations +
Proceedings Volume 6503, Machine Vision Applications in Industrial Inspection XV; 650308 (2007) https://doi.org/10.1117/12.713584
Event: Electronic Imaging 2007, 2007, San Jose, CA, United States
Abstract
This paper aims at reviewing the recent published works dealing with industrial applications which rely on Infrared Radiation and of its main variations. Some of its applications are reviewed domain by domain. Distinction between near infrared (visible to 1.1 microns) which enables high temperature measurements, versus classical IR spectrum( SW and LW) range used for low temperature range is done, as well as difference between active and passive thermography.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
F. Meriaudeau "Infrared imaging and machine vision", Proc. SPIE 6503, Machine Vision Applications in Industrial Inspection XV, 650308 (17 February 2007); https://doi.org/10.1117/12.713584
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Cited by 3 scholarly publications.
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KEYWORDS
Thermography

Infrared radiation

Infrared imaging

Nondestructive evaluation

Temperature metrology

Inspection

Machine vision

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