A Novel Measurement Technique Of Loss And Facet Reflectivity For Semiconductor Optical Waveguide

Yasushi Matsui; Masato Ishino; Toshihiro Fujita; Hiroyuki Serizawa; Takao Kajiwara

doi:10.1117/12.938161

3 November 1986 A Novel Measurement Technique Of Loss And Facet Reflectivity For Semiconductor Optical Waveguide

Yasushi Matsui, Masato Ishino, Toshihiro Fujita, Hiroyuki Serizawa, Takao Kajiwara

Proceedings Volume 0651, Integrated Optical Circuit Engineering III; (1986) https://doi.org/10.1117/12.938161
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria

Abstract

We have proposed a novel technique to measure loss and facet reflectivity of semiconductor waveguides using Fabry-Perot resonance characterization. In order to obtain stable visibility of the optical transmittance, this technique has for the first time adopted a unique electro-optic effect instead of temperature-dependent Fabry-Perot resonance method. As a result, very accurate measurement has been realized as compared with those of currently available other measurement technique. Also we discussed the relation between spectral characteristics of incident light sources and waveguide parameters, and verified the conditions of this measurement to meet tight requirements of the waveguides.

Citation Download Citation

Yasushi Matsui, Masato Ishino, Toshihiro Fujita, Hiroyuki Serizawa, and Takao Kajiwara "A Novel Measurement Technique Of Loss And Facet Reflectivity For Semiconductor Optical Waveguide", Proc. SPIE 0651, Integrated Optical Circuit Engineering III, (3 November 1986); https://doi.org/10.1117/12.938161

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