A wafer scale active pixel CMOS image sensor for generic x-ray radiology

Danny Scheffer

doi:10.1117/12.708433

16 March 2007 A wafer scale active pixel CMOS image sensor for generic x-ray radiology

Danny Scheffer

Author Affiliations +

Proceedings Volume 6510, Medical Imaging 2007: Physics of Medical Imaging; 65100O (2007) https://doi.org/10.1117/12.708433
Event: Medical Imaging, 2007, San Diego, CA, United States

Abstract

This paper describes a CMOS Active Pixel Image Sensor developed for generic X-ray imaging systems using standard CMOS technology and an active pixel architecture featuring low noise and a high sensitivity. The image sensor has been manufactured in a standard 0.35 μm technology using 8" wafers. The resolution of the sensor is 3360x3348 pixels of 40x40 μm² each. The diagonal of the sensor measures little over 190 mm. The paper discusses the floor planning, stitching diagram, and the electro-optical performance of the sensor that has been developed.

Citation Download Citation

Danny Scheffer "A wafer scale active pixel CMOS image sensor for generic x-ray radiology", Proc. SPIE 6510, Medical Imaging 2007: Physics of Medical Imaging, 65100O (16 March 2007); https://doi.org/10.1117/12.708433

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE