Paper
29 March 2007 Training a CAD classifier with correlated data
Murat Dundar, Balaji Krishnapuram, Matthias Wolf, Sarang Lakare, Luca Bogoni, Jinbo Bi, R. Bharat Rao
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Abstract
Most methods for classifier design assume that the training samples are drawn independently and identically from an unknown data generating distribution (i.i.d.), although this assumption is violated in several real life problems. Relaxing this i.i.d. assumption, we develop training algorithms for the more realistic situation where batches or sub-groups of training samples may have internal correlations, although the samples from different batches may be considered to be uncorrelated; we also consider the extension to cases with hierarchical--i.e. higher order--correlation structure between batches of training samples. After describing efficient algorithms that scale well to large datasets, we provide some theoretical analysis to establish their validity. Experimental results from real-life Computer Aided Detection (CAD) problems indicate that relaxing the i.i.d. assumption leads to statistically significant improvements in the accuracy of the learned classifier.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Murat Dundar, Balaji Krishnapuram, Matthias Wolf, Sarang Lakare, Luca Bogoni, Jinbo Bi, and R. Bharat Rao "Training a CAD classifier with correlated data", Proc. SPIE 6514, Medical Imaging 2007: Computer-Aided Diagnosis, 65140H (29 March 2007); https://doi.org/10.1117/12.709536
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KEYWORDS
Computer aided diagnosis and therapy

Computer aided design

Data modeling

Statistical modeling

Data mining

Algorithm development

Statistical analysis

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