Microscale damping using thin film active materials

Catherine A. Kerrigan; Ken K. Ho; K. P. Mohanchandra; Gregory P. Carman

doi:10.1117/12.716592

27 April 2007 Microscale damping using thin film active materials

Catherine A. Kerrigan, Ken K. Ho, K. P. Mohanchandra, Gregory P. Carman

Proceedings Volume 6525, Active and Passive Smart Structures and Integrated Systems 2007; 65250V (2007) https://doi.org/10.1117/12.716592
Event: SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring, 2007, San Diego, California, United States

Abstract

This paper focuses on understanding and developing a new approach to dampen MEMS structures using both experiments and analytical techniques. Thin film Nitinol and thin film Terfenol-D are evaluated as a damping solution to the micro scale damping problem. Stress induced twin boundary motion in Nitinol is used to passively dampen potentially damaging vibrations. Magnetic domain wall motion is used to passively dampen vibration in Terfenol-D. The thin films of Nitinol, Nitinol/Silicon laminates and Nitinol/Terfenol-D/Nickel laminates have been produced using a sputter deposition process and damping properties have been evaluated. Dynamic testing shows substantial damping (tan &dgr;) measurable in each case. Nitinol film samples were tested in the Differential Scanning Calorimetry (DSC) to determine phase transformation temperatures. The twin boundary mechanism by which energy absorption occurs is present at all points below the Austenite start temperature (approximately 69°C in our film) and therefore allows damping at cold temperatures where traditional materials fail. Thin film in the NiTi/Si laminate was found to produce substantially higher damping (tan &dgr; = 0.28) due to the change in loading condition. The NiTi/Si laminate sample was tested in bending allowing the twin boundaries to be reset by cyclic tensile and compressive loads. The thin film Terfenol-D in the Nitinol/Terfenol-D/Nickel laminate was shown to produce large damping (tan &dgr; = 0.2). In addition to fabricating and testing, an analytical model of a heterogeneous layered thin film damping material was developed and compared to experimental work.

Citation Download Citation

Catherine A. Kerrigan, Ken K. Ho, K. P. Mohanchandra, and Gregory P. Carman "Microscale damping using thin film active materials", Proc. SPIE 6525, Active and Passive Smart Structures and Integrated Systems 2007, 65250V (27 April 2007); https://doi.org/10.1117/12.716592

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