Paper
27 April 2007 On the effect of electrical uncertainties on resonant piezoelectric shunting
Maurizio Porfiri, Ugo Andreaus
Author Affiliations +
Abstract
In this paper we study the effect of electrical uncertainties on resonant piezoelectric shunting. Simple closed form formulas for quantifying the performance loss due to deterministic variations of the electrical elements are derived, and validated through numerical tests. The effect of stochastic perturbations is also considered, manageable formulas are provided, and validated by Monte Carlo simulations. The analyses focus on forced vibrations, and the arising H (infinity) optimization problem is solved by making use of fundamental properties of the system transfer function.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maurizio Porfiri and Ugo Andreaus "On the effect of electrical uncertainties on resonant piezoelectric shunting", Proc. SPIE 6525, Active and Passive Smart Structures and Integrated Systems 2007, 652511 (27 April 2007); https://doi.org/10.1117/12.715257
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KEYWORDS
Inductance

Transducers

Capacitance

Resistance

Electrodes

Monte Carlo methods

Solids

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