Paper
3 May 2007 Hydrogenated water application for particle removal on EUV mask blank substrates
Author Affiliations +
Proceedings Volume 6533, 23rd European Mask and Lithography Conference; 653311 (2007) https://doi.org/10.1117/12.737174
Event: European Mask and Lithography Conference2007, 2007, Grenoble, France
Abstract
The capability of hydrogenated water to clean EUV blank substrates was examined. The hydrogenated water cleaning process was compared with an H2O2/NH4OH/H2O mixture (SC1) and ozonated water cleaning processes. A small amount ammonia added to the hydrogenated water improved the particle removal efficiency. The concentration of hydrogen and the method used to dispense the water had little effect. The use of ozonated and hydrogenated water together gave high particle removal efficiencies, which were similar to those obtained using SC1. Additionally, the use of ozonated water with hydrogenated water further reduced the amount ammonia required to achieve high particle removal efficiencies. With further process optimization hydrogenated and ozonated water has the potential to replace SC1 in cleaning EUV substrates.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sean Eichenlaub, Abbas Rastegar, Peter Dress, Fei Xu, and Pat Marmillion "Hydrogenated water application for particle removal on EUV mask blank substrates", Proc. SPIE 6533, 23rd European Mask and Lithography Conference, 653311 (3 May 2007); https://doi.org/10.1117/12.737174
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KEYWORDS
Particles

Extreme ultraviolet

Hydrogen

Photomasks

Lithography

Acquisition tracking and pointing

Defect inspection

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