OASIS: cryogenically optimized resistive arrays and IRSP subsystems for space-background IR simulation

Jay James; Joe LaVeigne; Jim Oleson; Greg Matis; John Lannon; Scott Goodwin; Alan Huffman; Steve Solomon; Paul Bryant

doi:10.1117/12.720610

30 April 2007 OASIS: cryogenically optimized resistive arrays and IRSP subsystems for space-background IR simulation

Jay James, Joe LaVeigne, Jim Oleson, Greg Matis, John Lannon, Scott Goodwin, Alan Huffman, Steve Solomon, Paul Bryant

Proceedings Volume 6544, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII; 654405 (2007) https://doi.org/10.1117/12.720610
Event: Defense and Security Symposium, 2007, Orlando, Florida, United States

Abstract

SBIR has completed the development of the first lot of OASIS emitter arrays and custom packaging for cryogenic IR scene projection applications. OASIS performance requirements include a maximum MWIR apparent temperature of greater than 600 K, with 10-90% radiance rise time of less than 6.5 ms. Four (4) arrays have been packaged, integrated, tested and delivered. This paper will report on the first measurements taken of the OASIS resistive emitter arrays at both ambient and cryogenic temperatures. This paper will also provide a discussion of the OASIS cryogenic projector/electronics module (Cryo-PEM) design. We will also describe the novel thermal design employed within the array package and Cryo-PEM assemblies, which allows OASIS to produce radiometrically accurate imagery with reduced thermal lag/gradient artifacts compared to legacy Honeywell cryogenic IRSP assemblies. As OASIS supports both analog and digital input, we will discuss the differences between the two modes in terms of system integration, support electronics and overall array performance.

Citation Download Citation

Jay James, Joe LaVeigne, Jim Oleson, Greg Matis, John Lannon, Scott Goodwin, Alan Huffman, Steve Solomon, and Paul Bryant "OASIS: cryogenically optimized resistive arrays and IRSP subsystems for space-background IR simulation", Proc. SPIE 6544, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII, 654405 (30 April 2007); https://doi.org/10.1117/12.720610

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available