Paper
18 May 2007 Multilayers for next-generation x-ray sources
Author Affiliations +
Abstract
Multilayers are artificially layered structures that can be used to create optics and optical elements for a broad range of x-ray wavelengths, or can be optimized for other applications. The development of next generation x-ray sources (high brightness synchrotrons and x-ray free electron lasers) requires advances in x-ray optics. Newly developed multilayer-based mirrors and optical elements enabled efficient band-pass filtering, focusing and time resolved measurements in recent FLASH (Free Electron LASer in Hamburg) experiments. These experiments are providing invaluable feedback on the response of the multilayer structures to high intensity, short pulsed x-ray sources. This information is crucial to design optics for future x-ray free electron lasers and to benchmark computer codes that simulate damage processes.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Bajt, H. N. Chapman, E. Spiller, S. Hau-Riege, J. Alameda, A. J. Nelson, C. C. Walton, B. Kjornrattanawanich, A. Aquila, F. Dollar, E. Gullikson, C. Tarrio, and S. Grantham "Multilayers for next-generation x-ray sources", Proc. SPIE 6586, Damage to VUV, EUV, and X-ray Optics, 65860J (18 May 2007); https://doi.org/10.1117/12.724786
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Cited by 8 scholarly publications.
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KEYWORDS
Reflectivity

Mirrors

Free electron lasers

Multilayers

Silicon

X-ray optics

X-rays

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