Moiré deflectometry used for refractive index measurements

J. Keprt; L. Bartoněk

doi:10.1117/12.739669

12 April 2007 Moiré deflectometry used for refractive index measurements

J. Keprt, L. Bartoněk

Proceedings Volume 6609, 15th Czech-Polish-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics; 66090Z (2007) https://doi.org/10.1117/12.739669
Event: 15th Czech-Polish-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics, 2006, Liberec, Czech Republic

Abstract

To describe the optical characteristics of phase object the moire deflectometry system can be used. A Talbot interferometer is constructed with two gratings placed in a collimated beam of light. The moire fringes are generated by superimposing the self-imaged grating in Talbot plane with the second reference grating (of the some period or near the some period as the first one). If the phase object is placed on front of the first grating, the light deflected by the object yields the shifted Talbot images and the resultant moire fringes show the change of the refractive index of the phase object. This method can be also used for measurement of the refractive index of lenses as well as liquids and gases showing self-focusing and self-defocusing effect. Computerized video-image than enables observation and evaluation of changes of moire fringes practically in real-time. In comparison with other interferometric methods the advantages of the moire deflectometry technique are its extreme experimental simplicity, low cost and low sensitivity to external disturbances.

Citation Download Citation

J. Keprt and L. Bartoněk "Moiré deflectometry used for refractive index measurements", Proc. SPIE 6609, 15th Czech-Polish-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics, 66090Z (12 April 2007); https://doi.org/10.1117/12.739669

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