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25 November 1986 Simultaneous Laser Beam Profiling And Scaling Using Diffraction Edge Waves (DEW)
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Proceedings Volume 0661, Optical Testing and Metrology; (1986) https://doi.org/10.1117/12.938632
Event: 1986 Quebec Symposium, 1986, Quebec City, Canada
Abstract
A simple method of laser beam profiling using a scanning knife-edge is presented. Instead of monitoring the nonobstructed part of the beam as is usually done, the photo-detector is placed completely outside the beam and measures the light intensity of the DEW. Thus the spatial profile of very small Gaussian beams is obtained directly on an oscilloscope without any inversion procedure. By using the DEW emitted by another beam focused through a grating it is also possible to get a spatial calibration scale.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pierre Langlois and Roger A. Lessard "Simultaneous Laser Beam Profiling And Scaling Using Diffraction Edge Waves (DEW)", Proc. SPIE 0661, Optical Testing and Metrology, (25 November 1986); https://doi.org/10.1117/12.938632
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