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18 June 2007 Digital micromirror device application for inline characterization of solar cells by tomographic light beam-induced current imaging
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Abstract
Light Beam-Induced Current (LBIC) imaging is a well-known characterization technique for solar cells, which allows to detect regions of low crystal quality. In this paper a fast, robust and reliable LBIC system is proposed by the use of digital micromirror device (DMD). The LBIC technique is usually performed by point-by-point mechanical sample scanning under a laser spot or by laser scanning, which leads to a measurement time of at least several minutes. In this proposed system with DMD, a new technique is introduced, in which a solar cell is scanned from different angles by a light-line instead of a light-spot. The obtained photocurrent data from these scans are used to reconstruct an LBIC image by using tomography principles. This leads to a lower number of measurements compared to any point scan method. This method helps in reducing measurement time and makes LBIC a fast characterization tool capable for inline investigations. Light-line scans over the cell from different angles are realized by a digital micromirror device (DMD) and its parallel interface controller. The DMD provides a fast solution for line-scanning the cell at speed up to 4 kHz, leading to a measure time of a few tens of seconds for a 256x256 pixel image. Since there are no moving parts involved in this setup, it is a robust and compact system, which will be ideal for the field environment and inline characterization.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Gupta and O. Breitenstein "Digital micromirror device application for inline characterization of solar cells by tomographic light beam-induced current imaging", Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66160O (18 June 2007); https://doi.org/10.1117/12.726384
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