Paper
18 June 2007 DLP based fringe projection as an optical 3D inline measuring method for inspection in manufacturing
Gottfried Frankowski, Michael Stenzel
Author Affiliations +
Abstract
The application of fast 3D measuring methods is a fundamental venture in industrial measuring technology. This paper introduces the digital fringe projection technology based on the Digital Light Projection technology (DLP) from Texas Instruments as a measuring method for inline 3D measurement and inspection for industrial use. In this paper in the first part will be described the fundamental principles of the used 3D measuring method and the calibration of the measuring devices. In the second part will be described and/or represented the special needs of the hard and software components enabling the application of the digital fringe projection technology as a 3D inline measuring method for manufacturing systems. In a third part of the paper is described an inline system for 3D measurement and/or inspection of electronic components.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gottfried Frankowski and Michael Stenzel "DLP based fringe projection as an optical 3D inline measuring method for inspection in manufacturing", Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66160U (18 June 2007); https://doi.org/10.1117/12.726090
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KEYWORDS
3D metrology

Digital Light Processing

Calibration

Measurement devices

Fringe analysis

Projection systems

Optics manufacturing

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