About the possibility of using optical bistability effect in metrology systems

Claudia Yu. Zenkova

doi:10.1117/12.725987

18 June 2007 About the possibility of using optical bistability effect in metrology systems

Claudia Yu. Zenkova

Proceedings Volume 6616, Optical Measurement Systems for Industrial Inspection V; 66160Z (2007) https://doi.org/10.1117/12.725987
Event: Optical Metrology, 2007, Munich, Germany

Abstract

The impact of a weak external magnetic field upon the conditions of optical bistability (OB) realization in the exciton absorption region of layer semiconductors has been investigated. With the 2H-polytype PbI₂ used as an example, the possibility of obtaining the OB realization region by changing the external magnetic field intensity has been shown. This effect can be used as a basic guideline in measuring the level of laser radiation signals, and can provide means for metrological maintenance of systems working in different active regime.

Citation Download Citation

Claudia Yu. Zenkova "About the possibility of using optical bistability effect in metrology systems", Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66160Z (18 June 2007); https://doi.org/10.1117/12.725987

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