Composition of virtual speckle pattern for spatial fringe analysis method in ESPI by using single camera

Y. Arai; R. Shimamura; S. Yokozeki

doi:10.1117/12.726018

18 June 2007 Composition of virtual speckle pattern for spatial fringe analysis method in ESPI by using single camera

Y. Arai, R. Shimamura, S. Yokozeki

Proceedings Volume 6616, Optical Measurement Systems for Industrial Inspection V; 661611 (2007) https://doi.org/10.1117/12.726018
Event: Optical Metrology, 2007, Munich, Germany

Abstract

A high resolution new fringe analysis method for ESPI with only one camera is proposed by using features of speckle interferometry in deformation process. The profile of intensity of each speckle of speckle patterns in the deformation process is analyzed by Hilbert transformation. A virtual speckle pattern for creating a carrier fringe image is produced artificially. The deformation map can be detected by the virtual speckle pattern in the operation based on spatial fringe analysis method. Experimental results show that the difference between the results by the new and the ordinary methods is less than 0.12 rad as standard deviation.

Citation Download Citation

Y. Arai, R. Shimamura, and S. Yokozeki "Composition of virtual speckle pattern for spatial fringe analysis method in ESPI by using single camera", Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 661611 (18 June 2007); https://doi.org/10.1117/12.726018

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