Influence of non-linearities in wavelength-swept absolute distance interferometry

Luc Perret; Pierre Pfeiffer; Ayoub Chakari

doi:10.1117/12.726025

18 June 2007 Influence of nonlinearities in wavelength-swept absolute distance interferometry

Luc Perret, Pierre Pfeiffer, Ayoub Chakari

Proceedings Volume 6616, Optical Measurement Systems for Industrial Inspection V; 66161X (2007) https://doi.org/10.1117/12.726025
Event: Optical Metrology, 2007, Munich, Germany

Abstract

This paper reports the optimization possibilities of some non-linear sources of limitations in the resolution and accuracy of an Absolute Distance Interferometry setup using an External Cavity Laser Diode for wavelength scanning and a fibered Mach-Zehnder interferometer as a reference. The system is able to measure one or two simultaneous targets with a relative uncertainty of some 10^-6 for distances of 1 to 20m. In order to achieve better performances, the experimental non-linearities in the wavelength sweep are isolated and compared to different simulated sweeping models. This study leads to the conclusion that accuracy and resolution could be improved by an optimal modulation of the wavelength sweep. Another sensible point is the drift of the reference Optical Path Difference of the Mach-Zehnder with temperature variations. This drift can be minimized by using an acrylate-coated fiber and a copper-coated fiber of different lengths, adjusted by experimental measurements in a climatic chamber for a 10 to 40°C range.

Citation Download Citation

Luc Perret, Pierre Pfeiffer, and Ayoub Chakari "Influence of nonlinearities in wavelength-swept absolute distance interferometry", Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66161X (18 June 2007); https://doi.org/10.1117/12.726025

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