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11 July 2007 Localized recording approaches and phase metrology for holographic storage
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Proceedings Volume 6620, Optical Data Storage 2007; 66200C (2007) https://doi.org/10.1117/12.738585
Event: Optical Data Storage 2007, 2007, Portland, OR, United States
Abstract
The number of layers of a micro-holographic disk is limited by wavefront aberration which is strongly dependent on the photopolymer initiation, termination and inhibition kinetics. 3D metrology is used to validate predicted index profiles.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert R. McLeod, Matthew W. Grabowski, Mark R. Ayres, and Amy C. Sullivan "Localized recording approaches and phase metrology for holographic storage", Proc. SPIE 6620, Optical Data Storage 2007, 66200C (11 July 2007); https://doi.org/10.1117/12.738585
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