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22 February 2008 Numerical simulation of polarized bidirectional reflectance distribution function (BRDF) based on micro-facet model
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Proceedings Volume 6622, International Symposium on Photoelectronic Detection and Imaging 2007: Laser, Ultraviolet, and Terahertz Technology; 66220A (2008) https://doi.org/10.1117/12.790729
Event: International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007, 2007, Beijing, China
Abstract
The polarized light scattered by the surface of a material contains information that can be used to describe the properties of the surface. Polarized Bidirectional Reflectance Distribution Function (BRDF) is one of the most important factors used to represent the property of the surface. It uses a 4×4 matrix (Mueller matrix) to describe the properties of the light scattered from the surface. A polarized BRDF model based on the micro-facet theory is used in the numerical simulation. The optical constant parameters contained in the model is derived from the experimental data through genetic algorithm. Comparison between the model calculation and the experimental data shows that this model agrees well with the experimental data, and can be used in the future work.
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Weiwei Feng, Qingnong Wei, Shimei Wang, Shisheng Liu, Dexia Wu, Zengdong Liu, and Dongfang Wang "Numerical simulation of polarized bidirectional reflectance distribution function (BRDF) based on micro-facet model", Proc. SPIE 6622, International Symposium on Photoelectronic Detection and Imaging 2007: Laser, Ultraviolet, and Terahertz Technology, 66220A (22 February 2008); https://doi.org/10.1117/12.790729
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