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5 March 2008 Study and application of corner detecting and locating on color aberration analysis of tiles
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Proceedings Volume 6623, International Symposium on Photoelectronic Detection and Imaging 2007: Image Processing; 66231B (2008) https://doi.org/10.1117/12.791501
Event: International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007, 2007, Beijing, China
Abstract
This paper base on online detecting and position-setting of tiles and introduce two methods of corner detecting. The methods are MIC corner to withdraw the operator and Harris corner to withdraw the operator. It compares the characters of the two algorithms and uses Harris corner extraction operator to offer on-line detection and localization of tiles. It also analyses and divides the image detection window and offers important method for extracting and analyzing of color character of image.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yanwen Li, Genfeng Bi, Xinyan Huang, and Longjiang Zheng "Study and application of corner detecting and locating on color aberration analysis of tiles", Proc. SPIE 6623, International Symposium on Photoelectronic Detection and Imaging 2007: Image Processing, 66231B (5 March 2008); https://doi.org/10.1117/12.791501
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