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12 March 2008 Antireflection coatings of broad angle range for ultraviolet band designed by rugate coatings
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Proceedings Volume 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing; 662424 (2008) https://doi.org/10.1117/12.791214
Event: International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007, 2007, Beijing, China
Abstract
Rugate coatings are usually defined as optical coatings that present a continuous variation of refractive index in the direction perpendicular to the film plane. Such kind of optical coating has optical and mechanical properties that differ from those of conventional high-low-index stacks. Especially, the broad angle range and the low optical scatter level make them superior to traditional stacks. Antireflective (AR) coatings have found increasing applications. In this paper, the principal aspects of rugate coatings theory are discussed and the emphasis is focused on polarization effect of the incident light. The reason accounting for difference of the transmissivity was analyzed in the case of polarization and board angle incidence. To eliminate polarization effect, a method of designing antireflection coatings using rugate coatings was demonstrated. Antireflection coatings for the ultraviolet spectral region in the wavelength range 300-400 nm and incidence angle from 0 to 80 degree were designed. Then the implementation of optimization recurred to optimac and conjugate gradient. It shows that the result of optimization is ideal. For AR coatings, this design method can enhance the ratio of utilization of optical energy.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Guanliang Peng, Jiankun Yang, Shengli Chang, Hongwei Yin, and Juncai Yang "Antireflection coatings of broad angle range for ultraviolet band designed by rugate coatings", Proc. SPIE 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing, 662424 (12 March 2008); https://doi.org/10.1117/12.791214
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