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7 May 2007 Theoretical and numerical analysis of the microring resonator refractometers
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Proceedings Volume 6635, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III; 663504 (2007) https://doi.org/10.1117/12.741829
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III, 2006, Bucharest, Romania
Abstract
Theoretical and numerical studies regarding the possibility of using simple laterally coupled microring resonators as refractometers are presented in this work. We have considered a core waveguide layer with its refractive index varying in the range 1.5...2 deposed on the silicon dioxide thermal grown layer. The waveguide width is set for achieving single-mode condition at 1.55 &mgr;m radiation wavelength. The aim of this work is finding the optimum configurations for microring resonators based refractive index sensors.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mihai Kusko and Dana Cristea "Theoretical and numerical analysis of the microring resonator refractometers", Proc. SPIE 6635, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III, 663504 (7 May 2007); https://doi.org/10.1117/12.741829
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