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8 May 2007 Refractive index measurement using comparative interferometry
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Proceedings Volume 6635, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III; 66350Q (2007) https://doi.org/10.1117/12.741908
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III, 2006, Bucharest, Romania
Abstract
The refractive index of a material medium is an important optical parameter since it exhibits the optical properties of the material. The adulteration problem is increasing day by day and hence simple, automatic and accurate measurement of the refractive index of materials is of great importance these days. For solid thin films materials Abeles method was reconsidered. Quick, measurements of refractive index using simple techniques and refractometers can help controlling adulteration of liquids of common use to a greater extent. Very simple interferometric set-up using Fizeau fringe patterns compares the fringe pitch as obtained in a cell with two levels: one down level with the unknown refractive index liquids and the upper level with gas air. A CCD matrix and a PC can handle the data and produce the results up to for digits.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mihaela Bojan, D. Apostol, V. Damian, P. C. Logofatu, F. Garoi, and Iuliana Iordache "Refractive index measurement using comparative interferometry", Proc. SPIE 6635, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III, 66350Q (8 May 2007); https://doi.org/10.1117/12.741908
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