Paper
11 September 2007 The research of oblique deposition of lanthanum fluoride thin films at 193nm
Ming-Chung Liu, Bo-Huei Liao, Wen-Hao Cho, Cheng-Chung Lee, Cheng-Chung Jaing
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Abstract
Oblique deposition of lanthanum fluoride thin films was prepared by thermal resistance evaporation. The characteristics (including microstructure, coefficient of tangent rule, birefringence at 193nm and stress) of lanthanum fluoride thin films of have been investigated. The deposition angles increased from 20 to 70 degree, the coefficient of tangent rule decreased from 0.7 to 0.37. When the deposition angles larger than 60 degree, the coefficient held a constant, 0.37. The refractive index at 193nm of oblique deposition films decreased with the deposition angles was larger than 40 degree. The residual stress of films achieved the minimum value at 20-degree deposition angle.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ming-Chung Liu, Bo-Huei Liao, Wen-Hao Cho, Cheng-Chung Lee, and Cheng-Chung Jaing "The research of oblique deposition of lanthanum fluoride thin films at 193nm", Proc. SPIE 6645, Nanoengineering: Fabrication, Properties, Optics, and Devices IV, 66451Y (11 September 2007); https://doi.org/10.1117/12.733616
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Cited by 2 scholarly publications.
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KEYWORDS
Thin films

Birefringence

Refractive index

Neptunium

Lanthanum

Resistance

Scanning electron microscopy

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