Emission and degradation mechanism of PLED

Mitsuhiro Koden; Yasuyuki Ohnishi; Masataka Nishimura; Hideki Uchida

doi:10.1117/12.731694

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16 October 2007 Emission and degradation mechanism of PLED

Mitsuhiro Koden, Yasuyuki Ohnishi, Masataka Nishimura, Hideki Uchida

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Proceedings Volume 6655, Organic Light Emitting Materials and Devices XI; 66550C (2007) https://doi.org/10.1117/12.731694
Event: Photonic Devices + Applications, 2007, San Diego, California, United States

Abstract

Emission and degradation mechanism of polymer light emitting diode (PLED) was investigated by using trap analysis. The device structure in this study is ITO/PEDOT-PSS/LEP/Ba/Al, where LEP (light emitting polymer) is polyfluorene type Lumation Green 1300 series supplied from Sumation Co., Ltd. The trap behaviors of virgin and degraded devices were investigated by using the bipolar devices, the hole only devices and the electron only devices. By analyzing the results, we successfully clarified depth and density of each trap at the interfaces and bulks of this PLED device. PL aging behavior and EL aging behavior were also examined for investigating mechanisms. This study shows such novel information that carrier traps at the PEDOT-PSS/LEP interface play an important role in emission and degradation characteristics.

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Mitsuhiro Koden, Yasuyuki Ohnishi, Masataka Nishimura, and Hideki Uchida "Emission and degradation mechanism of PLED", Proc. SPIE 6655, Organic Light Emitting Materials and Devices XI, 66550C (16 October 2007); https://doi.org/10.1117/12.731694

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