Paper
13 September 2007 Solubility- and temperature-driven thin film structures of polymeric thiophene derivatives for high performance OFET applications
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Abstract
It has been shown that high charge mobility in solution-processible organic semiconductor-based field effect transistors is due in part to a highly parallel π-π stacking plane orientation of the semiconductors with respect to gate-dielectric. Fast solvent evaporation methods, generally, exacerbate kinetically random crystal orientations in the films deposited, specifically, from good solvents. We have investigated solubility-driven thin film structures of thiophene derivative polymers via spin- and drop-casting with volatile solvents of a low boiling point. Among volatile solvents examined, marginal solvents, which have temperature-dependent solubility for the semiconductors (e.g. methylene chloride for regioregular poly(3-alkylthiophene)s), can be used to direct the favorable crystal orientation regardless of solvent drying time, when the temperature of gate-dielectrics is held to relatively cooler than the warm solution. Grazing-incidence X-ray diffraction and atomic force microscopy strongly support that significant control of crystal orientation and mesoscale morphology using a "cold" substrate holds true for both drop and spin casting. The effects of physiochemical post-modificaiton on film crystal structures and morphologies of poly(9,9-dioctylfluorene-co-bithiophene) have also been investigated.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Scott W. LeFevre, Zhenan Bao, Chang Y. Ryu, Richard W. Siegel, and Hoichang Yang "Solubility- and temperature-driven thin film structures of polymeric thiophene derivatives for high performance OFET applications", Proc. SPIE 6658, Organic Field-Effect Transistors VI, 665812 (13 September 2007); https://doi.org/10.1117/12.734032
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Cited by 2 scholarly publications.
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KEYWORDS
Crystals

Polymers

Chlorine

Field effect transistors

Thin films

Grazing incidence

Atomic force microscopy

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