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17 September 2007 Ultrasonic NDE of silicon carbide lightweight systems
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Abstract
Silicon carbide (SiC) high energy mirrors from M-Cubed, Schafer Corp, Poco and Trex Inc. were investigated using nondestructive ultrasound C-scan imaging. Reflected signal amplitude variations from the top surface of the SiC mirrors were imaged to locate surface and subsurface inhomogeneities. Where possible, the bottom surface reflected signal amplitude and material velocity were mapped to evaluate bulk properties. Elastic property mapping was also performed on a dense SiC mirror sample to look for regional variations in Poisson's ratio, Young's modulus, shear modulus, and bulk modulus. These ultrasound techniques were successfully utilized for detection of subsurface inhomogeneities in the SiC mirror samples.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrew R Portune, Richard A. Haber, and Raymond E. Brennan "Ultrasonic NDE of silicon carbide lightweight systems", Proc. SPIE 6666, Optical Materials and Structures Technologies III, 66660C (17 September 2007); https://doi.org/10.1117/12.736934
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