Calibration of a reversed-wavefront interferometer for polarization coherence metrology

Dean P. Brown; Alexis K. Spilman; Thomas G. Brown; Miguel A. Alonso; Riccardo Borghi; Massimo Santarsiero

doi:10.1117/12.734526

10 September 2007 Calibration of a reversed-wavefront interferometer for polarization coherence metrology

Dean P. Brown, Alexis K. Spilman, Thomas G. Brown, Miguel A. Alonso, Riccardo Borghi, Massimo Santarsiero

Proceedings Volume 6672, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III; 667207 (2007) https://doi.org/10.1117/12.734526
Event: Optical Engineering + Applications, 2007, San Diego, California, United States

Abstract

A reversed-wavefront Young interferometer has recently been proposed and demonstrated for a direct measurement of optical coherence. It relies on the creation of a reversed-wavefront replica of an electromagnetic beam in such a way that the coherence function of the initial beam can be mapped out by simple translation of a pair of pinholes in a Young's interference experiment. The same interferometer can, in principle, be used for polarization-dependent coherence measurements, but presents significant challenges. In this paper, we will describe the calibration of the interferometer and show measurements of the polarization-dependent coherence function of two optical sources.

Citation Download Citation

Dean P. Brown, Alexis K. Spilman, Thomas G. Brown, Miguel A. Alonso, Riccardo Borghi, and Massimo Santarsiero "Calibration of a reversed-wavefront interferometer for polarization coherence metrology", Proc. SPIE 6672, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III, 667207 (10 September 2007); https://doi.org/10.1117/12.734526

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