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26 September 2007 Characterization of very large format 1Kx1K LWIR QWIP focal plane array
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Focal plane arrays (FPAs), which are two-dimensional array of detectors hybridized to Read Out Integrated Circuits (ROIC), present unique challenges in characterization and functionality tests. Parameters such as temporal and spatial NEΔT, detectivity (D*), quantum efficiency (η), spectral response (R(λ)), etc., are generally the typical figures of merits. However, detailed operational information extractable from the electro-optical properties of the FPAs normally requires very time-consuming data analyses. One major difficulty in analyzing large format FPAs is the volume of data that are present in dealing with individual or group of pixels. Additional complications arise from circuit and subsystems that are an integral part of the FPA operations, and analyzing their effect individually requires detailed knowledge of the ROIC properties and the driving electronics. The noise analyses add another complexity in understanding the characteristics since noises can be generated externally as well as internally. The characterization techniques presented in this paper are performed specifically for very large format 1Kx1K LWIR QWIP FPA but will also be applicable to other types of FPAs.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Don Rafol, Eric Cho, and Wah Lim "Characterization of very large format 1Kx1K LWIR QWIP focal plane array", Proc. SPIE 6678, Infrared Spaceborne Remote Sensing and Instrumentation XV, 66780X (26 September 2007);

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